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Patent Searching and Data


Title:
INTERFERENCE MEASURING INSTRUMENT
Document Type and Number:
Japanese Patent JPS63223538
Kind Code:
A
Abstract:

PURPOSE: To measure an object surface which has a large aperture ratio by making a spherical wave incident on a hologram and also using a diffracted component of (+n)th order.

CONSTITUTION: Laser light projected from the final surface 4a of a reference converging lens 4 passes through a filter 5 arranged at the focus position of a lens 4 and also passes through the hologram 6 to impinge on the surface 7 to be measured which is a concave aspherical surface. When a spherical wave is incident, the hologram 6 is a zone plate type hologram where such a pattern that the diffracted component of +1st order has a wave front in an ideal aspherical surface shape at the position of the surface 7 to be measured is drawn. The laser light incident on the surface 7 to be measured is reflected by the surface 7 and diffracted again by the hologram 6 to reach the filter 5. At this time, only diffracted light containing measured surface information, i.e. diffracted component of +1st order in the light reflected by the surface 7 to be measured passes through the filter 5 and the remainder is cut off. Consequently, the contrast of interference fringes is increased and accurate measurement is performed.


Inventors:
KOBAYASHI KOSEI
Application Number:
JP5929787A
Publication Date:
September 19, 1988
Filing Date:
March 13, 1987
Export Citation:
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Assignee:
MINOLTA CAMERA KK
International Classes:
G01B9/02; G01B11/24; G01M11/00; G01M11/02; (IPC1-7): G01B9/02; G01B11/24; G01M11/00