Title:
ION BEAM GENERATOR AND ANALYZER
Document Type and Number:
Japanese Patent JP2019075299
Kind Code:
A
Abstract:
To provide an ion beam generator excellent in secondary ion generation efficiency of organic samples and analyzer using the ion beam generator.SOLUTION: An ion beam generator (300) includes an ion liquid, means (301) for supplying the ion liquid, and means (302) for emitting the ion liquid to form an ion beam. The ion liquid contains [CHNH], where n is an integer of 3 or less. Formation means includes an emission portion and electrodes (305a and 305b), the electrode (305a) may have a reception portion (306) for preventing a drop of the ion liquid, and the emission portion may be a needle body having a spiny tip. An analyzer using the ion beam generator is also disclosed.SELECTED DRAWING: Figure 3
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Inventors:
FUJIWARA YUKIO
SAITO NAOAKI
SAITO NAOAKI
Application Number:
JP2017201093A
Publication Date:
May 16, 2019
Filing Date:
October 17, 2017
Export Citation:
Assignee:
AIST
International Classes:
H01J27/26; G01N23/2258; H01J37/08; H01J37/252; H01J49/10; H01J49/40
Attorney, Agent or Firm:
Asamura patent office