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Title:
LAPPING METHOD
Document Type and Number:
Japanese Patent JP2000042903
Kind Code:
A
Abstract:

To shallow the depth of a pit without deteriorating productivity so much by using a second abrasive grain liquid containing abrasive grains smaller than abrasive grains of this liquid after performing work by using a first abrasive grain liquid.

As the first stage, lapping of 50 μm is performed by a first abrasive grain liquid (the maximum particle size is not more than 23 μm, the particle size of a 3% point of an accumulation height is not more than 20 μm, the particle size of a 50% point of the accumulation height is 7.1±0.7 μm and the particle size of a 94% point of the accumulation height is not less than 4.0 μm). Afterwards, lapping of 30 μm is also performed by a second abrasive grain liquid (the maximum particle size is not more than 19 μm, the particle size of a 3% point of a cumulative height is not more than 17 μm, the particle size of a 50% point of the cumulative height is 5.5 μm and the particle size of a 94% point of the cumulative height is not less than 3.0 μm). Thus, a work can be efficiently flattened in the first place by the abrasive grain liquid containing abrasive grains having the comparatively large particle size, and the depth of a pit can be reduced in the next place by the abrasive grain liquid containing abrasive grains having the small particle size.


Inventors:
NIHONMATSU TAKASHI
MIYAZAKI SEIICHI
YOSHIDA MASAHIKO
HAYASHI NOBUYUKI
KASUGA MASAHITO
Application Number:
JP21383498A
Publication Date:
February 15, 2000
Filing Date:
July 29, 1998
Export Citation:
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Assignee:
SHINETSU HANDOTAI KK
NAGANO ELECTRONICS IND
International Classes:
B24B37/00; H01L21/304; (IPC1-7): B24B37/00; H01L21/304
Attorney, Agent or Firm:
Shoji Ishihara