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Title:
LASER ANNEAL PROCESSING UNIT AND LASER ANNEAL PROCESSING METHOD
Document Type and Number:
Japanese Patent JP2012015445
Kind Code:
A
Abstract:

To provide a laser anneal processing unit which can increase a margin of pulse energy density without increasing proper pulse energy density when annealing by irradiation with pulse laser light of a semiconductor film.

A laser anneal processing unit comprises a laser light source for outputting pulse laser light; an optical system for shaping and guiding the pulse laser light to a semiconductor film to be processed; and a stage for installing the semiconductor film to be irradiated with the pulse laser light. The pulse laser light irradiating the semiconductor film has a rising time from 10% of the maximum height to the maximum height in pulse energy density, of 35 nsec or less, and a falling time from the maximum height to 10% of the maximum height, of 80 nsec or more. Accordingly, a margin of the pulse energy density is increased without exceptional increase in the pulse energy density suitable for crystallization, and an excellent anneal processing is performed without lowering throughput.


Inventors:
TSUGITA JUNICHI
CHUNG SUGHWAN
MACHIDA MASASHI
Application Number:
JP2010152988A
Publication Date:
January 19, 2012
Filing Date:
July 05, 2010
Export Citation:
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Assignee:
JAPAN STEEL WORKS LTD
International Classes:
H01L21/20; B23K26/00; B23K26/067; B23K26/073; B23K26/352; H01L21/268; H01S3/00
Domestic Patent References:
JP2002541679A2002-12-03
JPH09161264A1997-06-20
JP2003273040A2003-09-26
JP2002176006A2002-06-21
Attorney, Agent or Firm:
Yuki Yokoi