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Title:
LASER IONIZATION NEUTRAL PARTICLE MASS SPECTROMETRY METHOD
Document Type and Number:
Japanese Patent JPH0729538
Kind Code:
A
Abstract:

PURPOSE: To carry out laser ionization neutral particle mass spectrometry efficiently with high sensitivity by scanning both a nonanalytical area and an analytical area, and sputtering the whole sputter area uniformly by combining plural scannings with each other.

CONSTITUTION: A signal to show that a radiating position of an ion beam 2 is within an analytical area is generated from scanning electrode electric power supply 15, and is inputted to a detecting time limiting device 16. Simultaneously with this, a laser beam 9 is generated from a laser generator 8, and prescribed time is delayed from a moment when the signal is inputted, and operation of a pulse counter 14 is started. Time delay is set in the same with necessary time during which a light exciting ion 10 generated just above a sample reaches a detector. When the whole sputter area is sputtered by combining plural scannings with each other, the laser beam is generated only when a beam radiating area is within an analytical area without increasing scanning speed, and photo-ionization of a neutral particle can be carried out efficiently.


Inventors:
MARUO TETSUYA
AZUMA YASUHIRO
Application Number:
JP17635993A
Publication Date:
January 31, 1995
Filing Date:
July 16, 1993
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE
International Classes:
G01N27/64; H01J37/252; (IPC1-7): H01J37/252; G01N27/64
Attorney, Agent or Firm:
Junnosuke Nakamura