Title:
LAYER THICKNESS ANALYSIS METHOD
Document Type and Number:
Japanese Patent JP2022083353
Kind Code:
A
Abstract:
To accurately analyze a layer thickness of each layer of a laminate composed of a fiber reinforced resin.SOLUTION: A layer thickness analyzer acquires a projected image of X-rays irradiated on a laminate 14 at an outer periphery of a high-pressure tank and imaged by a detector (steps 110 and 112), and generates an actual measurement profile indicating a change in the scattering intensity of X-rays along a radial direction (step 114). Further, the layer thickness analyzer assumes a position of a circumferential surface of a hoop layer, and generates a theoretical profile of the X-ray scattering intensity based on a scattering intensity function F(θ) as an optical characteristic of the X-ray scattering intensity (steps 122 and 124), and analyzes the position of the circumferential surface of the hoop layer by verifying the theoretical profile with the measured profile (step 126). Thereby, a layer thickness of each layer of the laminate can be easily and accurately analyzed.SELECTED DRAWING: Figure 4
Inventors:
MIURA YUZO
NAGAMATSU YUICHI
KAGEYAMA MASASHI
OKAJIMA KENICHI
KURIBAYASHI MASARU
NAGAMATSU YUICHI
KAGEYAMA MASASHI
OKAJIMA KENICHI
KURIBAYASHI MASARU
Application Number:
JP2020194755A
Publication Date:
June 03, 2022
Filing Date:
November 24, 2020
Export Citation:
Assignee:
TOYOTA MOTOR CORP
RIGAKU DENKI CO LTD
RIGAKU DENKI CO LTD
International Classes:
G01B15/02; G01N23/041
Attorney, Agent or Firm:
Patent Service Corporation Taiyo International Patent Office