圧延プロセスの学習制御装置

Japanese Patent JP7323051

B2

The learning control device according to an embodiment of the present invention calculates a predicted value on the basis of an actual value measured in a rolling process, calculates an instantaneous value of a learning rate on the basis of the difference between the calculated predicted value and the actual value of the rolling process, calculates an updated value of the learning rate on the basis of the instantaneous value of the learning rate and a previous value of a cell having corresponding rolling conditions in a learning rate table, updates the learning rate of the cell having the corresponding rolling conditions in the learning rate table, identifies an occurrence time of a sudden change in the learning rate on the basis of the instantaneous value of the learning rate stored in a rolling information database, detects a deviation from a standard of the instantaneous value of the learning rate before and after the occurrence time of the sudden change in the learning rate as a learning rate sudden change component, and re-updates the learning rate in the learning table by a correction based on the instantaneous value of the learning rate stored in the rolling information database at and after the identified occurrence time of the sudden change of the learning rate and on the learning rate sudden change component.

Masayasu Sekimoto

JP2022504721A

August 08, 2023

May 12, 2021

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Toshiba Mitsubishi Electric Industrial Systems Co., Ltd.

B21B37/00; G05B13/02

JP2009116759A
JP10031505A
JP7200005A

WO2015122010A1

Patent Attorney Takada / Takahashi International Patent Office

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