LEARNING DEVICE, INSPECTION DEVICE, LEARNING METHOD, AND INSPECTION METHOD

Title:

LEARNING DEVICE, INSPECTION DEVICE, LEARNING METHOD, AND INSPECTION METHOD

Document Type and Number:

Japanese Patent JP2023090960

Kind Code:

A

Abstract:

To generate a learning model through machine learning using teacher data while reducing the burden of generating the teacher data.SOLUTION: A learning device is provided comprising an arithmetic unit configured to generate teacher data by identifying a category of pixels of an image of a target object based on information on object property information and the category, and generate a trained model for outputting the category of the pixels upon receipt of an input of the image through machine learning using the teacher data.SELECTED DRAWING: Figure 2

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Inventors:

SUGASAWA YUYA
ARAI HIDEYUKI
AIKAWA TSUNE

Application Number:

JP2023078363A

Publication Date:

June 29, 2023

Filing Date:

May 11, 2023

Export Citation:

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Assignee:

PANASONIC IP MAN CORP

International Classes:

G06V10/774

Attorney, Agent or Firm:

Kenji Kamada
Kenji Maeda

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