To provide a lighting system for flaw inspection capable of emitting a band of uniform and light having linearity onto an inspecting material, regardless of the individual differences of light sources, and having superior stability.

This lighting system for forming a linear illumination pattern on the surface of the band-like or plate-like inspected material is provided with the plurality of light sources 10, optical fiber cables 13 for conducting light from the respective light sources 10, an optical fiber unit 14 with tips of the optical fiber cables 13 arranged linearly at random with a uniform ratio, and a lens 15 for converging the light going out from the optical fiber unit 14 into a fixed width of light at a fixed distance. A light source controller 12 controls so that the sum of the outputs from the plurality of light sources 10 brought into a fixed value, even when the output is reduced or bulb has failed in one of the light sources 10.