To provide a load driving device and semiconductor device that can protect switching elements against an abnormally high temperature, irrespective of whether the abnormally high temperature is caused by the switching elements or not.
When a detection result by an element temperature sensor 41 for detecting a temperature in the vicinity of FETs 31 to 33, which are switching elements, exceeds a predetermined temperature, and a detection result by a current sensor 51 corresponding to, for example, the FET 31 exceeds a predetermined current value, the abnormally high temperature is caused by the FET 31, and therefore the FET 31 is turned off. When respective detection results by current sensors 51 to 53 corresponding to all the FETs 31 to 33 do not exceed the predetermined current value, the abnormally high temperature is not caused by the FETs 31 to 33, and therefore the FET 31 connected to a rear fog lamp 61 having low importance in a vehicle is turned off. However, when the FET 31 has already been turned off, the FET 32 connected to a fog lamp 62 having second lowermost importance is turned off.
| WO/2009/085509 | SELECTIVE ELECTROLESS PLATING FOR ELECTRONIC SUBSTRATES |
FUJII SHIGEYUKI
SUMITOMO WIRING SYSTEMS
SUMITOMO ELECTRIC INDUSTRIES