Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
LOW TEMPERATURE TESTING APPARATUS
Document Type and Number:
Japanese Patent JPS5728235
Kind Code:
A
Abstract:

PURPOSE: To test the temperature characteristics of a matter to be measured simultaneously over the entire measuring area of the matter with a broad surface by covering it with a closed housing.

CONSTITUTION: A low temperature testing apparatus 1 is placed on a cold insulator layer facing the bottom surface 5. A cooling agent feeder is connected to an injection port 17 and nozzles 18 and 19 and an inspection nozzle 23, a tray nozzle 24 and a drain nozzle 21 are closed. An antifreezing solution is injected into a housing 2 from an antifreezing solution injecting means 4 to such a level that the liquid surface is below the bottom surface of a vessel 3. A specific amount of cooling agent is fed to individual tanks in the vessel 3 housed from the cooling agent feeder. The temperature of the antifreezing solution is adjusted by states as follows: a rough adjustment thereof is performed with a selective feeding of the cooling agent to each tank while a fine adjustment with a change of the height of the vessel 3 through the positional adjustment of a suspension rod 10 by installation or removal of a liner 14. The cold heat of the antifreeze cooled down to a fixed temperature is transferred simultaneously to the bottom surface 5 thereof.


Inventors:
OZAKI MASAHIKO
NAKAO TAKESHI
TAKANO MASANOBU
Application Number:
JP10388180A
Publication Date:
February 15, 1982
Filing Date:
July 29, 1980
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
ISHIKAWAJIMA HARIMA HEAVY IND
International Classes:
G01M99/00; (IPC1-7): G01M19/00