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Patent Searching and Data


Title:
磁気探傷方法、磁界計測処理装置及び磁気探傷装置
Document Type and Number:
Japanese Patent JP7147801
Kind Code:
B2
Abstract:
A magnetic flaw detection method includes a magnetization step (S2) of moving a magnet (21) in a predetermined direction (D) along a surface of an object (7) that is a magnetic body and subsequently removing the magnet (21) from the surface of the object (7) to magnetize a region (R) corresponding to a movement range of the magnet (21) on the object (7), a sensor arrangement step (S3) of arranging a magnetic sensor (35a) to be capable of measuring magnetic flux leakage (8) generated from an abnormal portion (72) of the region (R) that was magnetized in the object (7), and a detection step (S4) of detecting an abnormality in the region (R) with the magnetic sensor (35a) arranged by the sensor arrangement step (S3).

Inventors:
Shinya Mito
Kazunori Miyazawa
Terao Bunhei
Shoma Takeda
Shoichi Shiozaki
Application Number:
JP2020044811A
Publication Date:
October 05, 2022
Filing Date:
March 13, 2020
Export Citation:
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Assignee:
Yokogawa Electric Corporation
International Classes:
G01N27/83
Domestic Patent References:
JP2017516111A
JP2006177747A
JP6087861U
JP3096855A
JP201258257A
Foreign References:
WO2020027043A1
US6549005
Attorney, Agent or Firm:
Kenji Sugimura
Mitsutsugu Sugimura
Tatsuya Tanaka