Title:
MAGNETIC PROBE EQUIPMENT
Document Type and Number:
Japanese Patent JP2014126440
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a magnetic search device capable of realizing a highly accurate magnetic search.SOLUTION: A first collar material 17 and a second collar material 18 are inserted to a first core material 6 which is inserted with a first coil 4, and a gap between the first coil 4 and a first permalloy stop 9A is eliminated, and the gap between the first coil 4 and a second permalloy stop 9B is eliminated. Further, a third collar material 19 and a fourth collar material 20 are inserted to a second core material 8 which is inserted with a second coil 5, and the gap between the second coil 5 and a third permalloy stop 9C is eliminated, and the gap between the second coil 5 and a fourth permalloy stop 9D is eliminated.
More Like This:
WO/2015/126417 | BENDER BAR MODAL SHAPING |
WO/2012/040035 | MAGNETOMECHANICAL MARKERS FOR MARKING STATIONARY ASSETS |
Inventors:
HIMENO TETSUJI
Application Number:
JP2012282835A
Publication Date:
July 07, 2014
Filing Date:
December 26, 2012
Export Citation:
Assignee:
OKINAWA KEISOKU CO LTD
MURATA MANUFACTURING CO
MURATA MANUFACTURING CO
International Classes:
G01V3/08
Domestic Patent References:
JPH0980132A | 1997-03-28 | |||
JPS5173464A | 1976-06-25 | |||
JPS4643601B1 |
Attorney, Agent or Firm:
Shuichiro Ariyoshi
Morita Yasuyuki
Morita Yasuyuki
Previous Patent: OBSERVATION METHOD FOR SCANNING TYPE PROBE MICROSCOPE
Next Patent: NONCONTACT TEMPERATURE SENSOR
Next Patent: NONCONTACT TEMPERATURE SENSOR