PURPOSE: To form a back side metal by initially depositing Ti having strong bonding force to GaAs in the formation of the back side metal of a GaAs semiconductor substrate formed with an element, and continuously depositing Au for preventing the Ti from oxidizing to prevent the element from deteriorating due to a heat treatment.
CONSTITUTION: The back surface of a GaAs semi-insulating semiconductor substrate 1 is treated, and formed in the prescribed thickness. Then, a Ti layer 2 is laminated in the thickness of approx. 500 by an electron beam depositing method, an Au layer 3 is continuously laminated in the thickness of approx. 2,500 by an electron beam depositing method, and an Sn layer 4 is laminated in the thickness of approx. 2W3μm by a resistance heating depositing method. Thereafter, it is divided into individual semiconductor pieces, and bonded to a base. Since the layer 2 having strong bonding force to the substrate 1 can be laminated at temperature of approx. room temperature, it can prevent the characteristics of the element formed on the substrate 1 from deteriorating.
NONAKA TOSHIO
UENISHI KATSUZO
JPS5829851B2 | 1983-06-25 | |||
JPS5654047A | 1981-05-13 |