PURPOSE: To improve the degree of integration by a method wherein impurities are introduced in a semiconductor substrate to stack two buried layers of different conductivity type in the manner of self-alignment.
CONSTITUTION: After a thin SiO2 film 12 and an oxidation-resistant Si3N4 film 13 formed on a P-type Si substrate surface are selectively eliminated, an N-type buried layer 14 is formed by introducing impurity, and a thick SiO2 film 15 is formed by thermal oxidation. After the film 13 is eliminated, a P-type channel stopper 16 is formed. After the films 12, 15 are eliminated, an N- type epitaxial layer 14 and a thin SiO2 film 18 are formed, and further an Si3N4 film 19 is selectively formed. By using the film 19 as a mask and performing heat treatment, a field oxide film 20 is formed to a depth not reaching the N+ type buried layer 14. By selective ion-implantation, a collector connection region 21, a base region 22 and an emitter region 23 are formed.
OGIUE KATSUMI
ODAKA MASANORI
NITTA TAKEHISA
JPS558095A | 1980-01-21 | |||
JPS5559738A | 1980-05-06 | |||
JPS5643756A | 1981-04-22 |