Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT
Document Type and Number:
Japanese Patent JPH02337
Kind Code:
A
Abstract:

PURPOSE: To improve the degree of integration by a method wherein impurities are introduced in a semiconductor substrate to stack two buried layers of different conductivity type in the manner of self-alignment.

CONSTITUTION: After a thin SiO2 film 12 and an oxidation-resistant Si3N4 film 13 formed on a P-type Si substrate surface are selectively eliminated, an N-type buried layer 14 is formed by introducing impurity, and a thick SiO2 film 15 is formed by thermal oxidation. After the film 13 is eliminated, a P-type channel stopper 16 is formed. After the films 12, 15 are eliminated, an N- type epitaxial layer 14 and a thin SiO2 film 18 are formed, and further an Si3N4 film 19 is selectively formed. By using the film 19 as a mask and performing heat treatment, a field oxide film 20 is formed to a depth not reaching the N+ type buried layer 14. By selective ion-implantation, a collector connection region 21, a base region 22 and an emitter region 23 are formed.


Inventors:
ISHIKAWA TAKASHI
OGIUE KATSUMI
ODAKA MASANORI
NITTA TAKEHISA
Application Number:
JP31635888A
Publication Date:
January 05, 1990
Filing Date:
December 16, 1988
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
H01L29/73; H01L21/331; H01L21/74; H01L21/76; H01L21/761; H01L29/72; H01L29/732; (IPC1-7): H01L21/331; H01L21/74; H01L21/76; H01L29/72; H01L29/73
Domestic Patent References:
JPS558095A1980-01-21
JPS5559738A1980-05-06
JPS5643756A1981-04-22
Attorney, Agent or Firm:
Katsuo Ogawa (1 person outside)



 
Next Patent: JPH02338