To reduce occurrence of a defect such as a void and to improve a coupling strength in manufacturing a coupled substrate.
The manufacturing method of a coupled substrate includes a coupling surface processing step for processing at least one of first and second substrates each including a coupling surface containing silicon and a coupling step for coupling the coupling surface of the first substrate and the coupling surface of the second substrate. The coupling surface processing step includes an OH radical increasing step S100 for increasing OH radicals on the coupling surface, and a moisture reducing step S120 for reducing moisture by heating the coupling surface whereon the OH radicals are increased, at a temperature within the range of 50 to 200°C.
JPS61145530 | MANUFACTURE OF THIN-FILM TRANSISTOR ARRAY |
WO/2021/230426 | DISPLAY DEVICE |
JP3053678 | MANUFACTURE OF SEMICONDUCTOR DEVICE |
MORIWAKI TAKAHARU
Shiro Takayanagi
Yasuhiro Otsuka
Shuji Kimura