Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
質量分析装置
Document Type and Number:
Japanese Patent JP7156553
Kind Code:
B2
Abstract:
A mass spectrometer includes: a first ion guide disposed in a first intermediate vacuum chamber; a first partition wall portion which constitutes at least a part of a partition wall separating the first intermediate vacuum chamber and a second intermediate vacuum chamber and has an ion passage hole; a second ion guide disposed in a second intermediate vacuum chamber; a second partition wall portion which constitutes at least a part of a partition wall which is a subsequent stage of the second intermediate vacuum chamber and has an ion passage hole; a first holding portion configured to integrally hold the first ion guide and the first partition wall portion; a second holding portion configured to hold the second ion guide; a coupling portion detachably connecting the first holding portion and the second holding portion; and a vacuum chamber main body portion to which an ion transport unit is detachably mounted.

Inventors:
Kohei Hosoo
Application Number:
JP2021561158A
Publication Date:
October 19, 2022
Filing Date:
August 11, 2020
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/24; H01J49/00; H01J49/06; H01J49/10
Domestic Patent References:
JP200184953A
Foreign References:
US20040211897
WO2019193171A1
US20080296495
Attorney, Agent or Firm:
Kyoto International Patent Office