Title:
MEASURED-DATA PROCESSING METHOD
Document Type and Number:
Japanese Patent JPH03282216
Kind Code:
A
Abstract:
PURPOSE:To compare both waves quantitatively by dividing the lateral axis of data into sections having an equal interval, forming dots from the changing width of longitudinal axis in the section, and comparing the numbers of the agreed dots in the mutually corresponding sections of both waves. CONSTITUTION:The lateral axis of measured waveform data to be compared to each other is divided into sections at an equal interval (d). The changing width (i) of the waveform data contained in the section in the longitudinal direction of the longitudinal axis is converted into the number of the dots in response to the width for every section. Thus the waveform is converted into a dot pattern. The numbers of the dots whose heights agree in the dot line on the same lateral axis for the two waveforms to be compared are obtained. The numbers of the agreed dots on the entire waveform dot patterns or on the parts of the patterns are used, and the waveform data are mutually compared. Therefore, when the waveforms are equal, the number of the agreed dots is maximum. When both wavelength become different, the number of the agreed dots is decreased rapidly, and the difference in waveforms appears sensitively.
Inventors:
MORITA KOICHI
Application Number:
JP8313590A
Publication Date:
December 12, 1991
Filing Date:
March 29, 1990
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01D1/00; G01D7/08; G01N25/00; G01N25/18; (IPC1-7): G01D1/00; G01D7/08; G01N25/00; G01N25/18
Attorney, Agent or Firm:
Kosuke Agata
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