MEASUREMENT DEVICE AND WAVEFORM DISPLAY METHOD

Japanese Patent JP2015108532

A

PROBLEM TO BE SOLVED: To provide a measurement device allowing past and latest measurement waveforms to be easily and visually distinguished and a position where the past and latest measurement waveforms overlap with each other and overlapping frequency thereof to be also visually confirmed, and further to provide a waveform display method.SOLUTION: A measurement device comprises at least: input means for sequentially taking in time series measurement data n times as specified number of times; display means for displaying the time series measurement data taken in as individual measurement waveforms for each time plotted on X-Y axes in an overlapped manner; and central processing means for integrally performing arithmetic control of each component thereof. Display of the measurement waveforms for n times is performed so as to allow the measurement waveforms to be visually distinguished from one another by comparing measurement values of past and latest times for each point positioned on the same Y-axis, determining whether or not a difference therebetween is equal to a threshold value or more and individually re-plotting the measurement value of the past time as point display capable of being univocally and visually distinguished when a determination result thereof is equal to the threshold value or more and as the point display capable of being subsidiarily and visually distinguished when the determination result thereof is less than the threshold value.

OGAWA TSUNEO

JP2013250933A

June 11, 2015

December 04, 2013

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HIOKI ELECTRIC WORKS

G01D9/00; G01R13/20

Hiroaki Kumagai

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