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Title:
MEASUREMENT JIG, THREE-DIMENSIONAL MEASUREMENT SYSTEM, AND THREE-DIMENSIONAL MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2022143957
Kind Code:
A
Abstract:
To three-dimensionally measure a protrusion such as a seal fin that linearly extends easily with good accuracy.SOLUTION: A measurement jig 30 pertaining to an embodiment of the present invention is attachable to a probe 21 which can be used when bringing a convex contact face 22a of a probe 21 into contact with a contact point at the tip of a protrusion 17 of a measurement object that extends linearly and measuring the three-dimensional position of the contact point at the tip of the protrusion 17. The measurement jig 30 comprises: a guide part 31 that can be arranged sandwiching both sides of the protrusion 17 while the measurement jig 30 is attached to the probe 21; and a holding part 32 that holds the measurement jig 30 to the probe 21 integrally with the guide part 31 while the measurement jig 30 is attached to the probe 21. The contact point at the tip of the protrusion 17 can be brought into contact with the convex contact face 22a of the probe 21 while the measurement jig 30 is attached to the probe 21.SELECTED DRAWING: Figure 6

Inventors:
NOMURA ATSUSHI
MIYA HIROYUKI
NISHIOKA KEN
TAKAHASHI NOBUTO
Application Number:
JP2021044766A
Publication Date:
October 03, 2022
Filing Date:
March 18, 2021
Export Citation:
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Assignee:
TOSHIBA CORP
TOSHIBA ENERGY SYSTEM & SOLUTION CORP
International Classes:
G01B5/00
Attorney, Agent or Firm:
Patent Attorney Sakura International Patent Office