Title:
MEASUREMENT METHOD, MEASUREMENT DEVICE, MEASUREMENT PROGRAM FOR OPTICAL CHARACTERISTICS OF OPTICAL MODULATOR
Document Type and Number:
Japanese Patent JP2023171798
Kind Code:
A
Abstract:
To provide a measurement method, measurement device and measurement program for measuring the optical characteristics of an optical modulator, each enabling the optical modulator and an optical fiber to be to automatically aligned.SOLUTION: A measurement method is provided, for measuring the optical characteristics of an optical modulator of Mach-Zehnder type that has an incidence unit, a waveguide propagating light entered from the incidence unit, and a plurality of emission units emitting light having propagated through the waveguide. The method comprises: a step of entering light from a light source to the incidence unit of the optical modulator via a first optical fiber; a step in which a plurality of reception units receive, via a plurality of second optical fibers, emitted light that is emitted from the plurality of emission units of the optical modulator; a step of converting, to a current, the electric signal output by each of the plurality of reception units by receiving the emitted light, and aggregating the magnitudes of the currents to thereby acquire a total value; and a step of aligning the axes of the incidence unit of the optical modulator and the first optical fiber on the basis of the total value.SELECTED DRAWING: Figure 4A
Inventors:
FUJII KOSUKE
Application Number:
JP2023149299A
Publication Date:
December 05, 2023
Filing Date:
September 14, 2023
Export Citation:
Assignee:
SUMITOMO ELECTRIC INDUSTRIES
International Classes:
G01M11/00; G02B6/42; G02F1/01
Attorney, Agent or Firm:
Shuhei Katayama