Title:
ポテンショメトリック測定プローブ用の測定方法および装置
Document Type and Number:
Japanese Patent JP5036818
Kind Code:
B2
Abstract:
A method and device are disclosed for measuring potentiometric measuring probes. An exemplary method includes feeding two test voltages comprising a harmonic wave Ueg with a base frequency fg and the harmonic wave Uer with a base frequency fr into two cores of a connecting cable through voltage source impedances, respectively. The voltage between an indicating electrode and a reference electrode, and the AC responding signal resulting from the two test voltages are passed to an amplifier and further to a transfer function unit having transfer functions (Hg, Hr), an A/D converter, and a Fourier transformation unit, to calculate a potential Ux and the two test responses Ug and Ur, respectively. Two calibration responses Uehg and Uehr are determined, wherein Uehg includes a product of Ueg and Hg, and wherein Uehr includes a product of Uer and Hr. Functional expressions are established for the test responses Ug and Ur, and the internal resistances Rg and Rr are determined by simultaneously solving equations having the unknown resistances Rg and Rr and capacitances C1 and C2. Accurate measurement of the internal resistance of the electrode can be achieved even with a relatively long connecting cable.
Inventors:
Wang, Chang Lin
Application Number:
JP2009526086A
Publication Date:
September 26, 2012
Filing Date:
August 28, 2007
Export Citation:
Assignee:
METTLER-TOLEDO Akchen Gesell Shaft
International Classes:
G01N27/416; G01N27/26
Domestic Patent References:
| JP2309240A | ||||
| JP8211015A | ||||
| JP62242849A | ||||
| JP6076854U | ||||
| JP4131764U |
Foreign References:
| US4822456 |
Attorney, Agent or Firm:
Shinjiro Ono
Kazuo Shamoto
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Tadashi Ueda
Kazuo Shamoto
Yasushi Kobayashi
Akio Chiba
Hiroyuki Tomita
Tadashi Ueda