Title:
MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP3251081
Kind Code:
B2
Abstract:
PURPOSE: To facilitate the adjustment of accuracy and maintenance in an electronic measuring apparatus.
CONSTITUTION: This measuring apparatus has a load cell 1 and a signal processing circuit 3, which processes the load signal from the load cell 1 and generates the measured signal representing the load. The load cell 1 has a strain generating body 5, which generates strain in response to the applied load, and a bridge circuit 4, which is formed of a pair of strain gages 7 and 8 that are fixed to the strain generating body 5 and a plurality of voltage dividing resistors 10-12. The load signal is taken out from a connecting point D between a pair of strain gages 7 and 8. Reference voltage signals VCOM and VREF are taken out from the connecting points C and E between a plurality of the voltage dividing resistors 10-12. The signals are inputted into the signal processing circuit 3. For the strain gages 7 and 8, the temperature compensating type resistors having the characteristics for compensating for the thermal- expansion temperature coefficient and the Young's modulus temperature coefficient of the strain generating bodies 5 are used.
Inventors:
Kenji Imai
Kazufumi Naito
Kazufumi Naito
Application Number:
JP35058792A
Publication Date:
January 28, 2002
Filing Date:
December 03, 1992
Export Citation:
Assignee:
ISHIDA CO.,LTD.
International Classes:
G01G3/14; G01B7/16; G01G3/18; G01G23/37; G01L1/22; (IPC1-7): G01G3/18; G01B7/16; G01L1/22
Domestic Patent References:
| JP6144326A | ||||
| JP2253130A | ||||
| JP158671B2 | ||||
| JP769232B2 |
Other References:
【文献】特許2683633(JP,B2)
Attorney, Agent or Firm:
Shuji Sugimoto
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