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Patent Searching and Data


Title:
MEASURING CIRCUIT FOR SEMICONDUCTOR DEVICE
Document Type and Number:
Japanese Patent JPH0521553
Kind Code:
A
Abstract:

PURPOSE: To prevent an oscillation when the electric characteristic of an elemen tal transistor is measured by a method wherein the abnormal oscillation of the transistor is absorbed by a series circuit which is composer of a capacitance and of a resistance equivalent to a constant impedance in a distributed constant line.

CONSTITUTION: The title circuit is provided with the following: distributed constant lines 14, of a constant impedance, which are connected to an input terminal at a transistor; a terminal 34, for measurement use, which is extended from an arbitray position in the distributed constant lines 14 and which is provided with a reactance component; and a series circuit which is connected to the opposite side of an input terminal for the distributed constant lines 14 and which is composed of a capacitance 44 and of a resistance 64 equivalent to a constant impedance in the distributed constant lines 14. Thereby, since an oscillation frequency can be absorbed up to a frequency whose constant impedance is guaranteed, it can be suppresses perfectly.


Inventors:
OTA TOSHIMICHI
ISHIKAWA OSAMU
AZUMA CHINATSU
Application Number:
JP16986391A
Publication Date:
January 29, 1993
Filing Date:
July 10, 1991
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01R31/26; H01L21/66; (IPC1-7): G01R31/26; H01L21/66
Attorney, Agent or Firm:
Akira Kobiji (2 outside)