計測デバイス - Nara Institute of Science and Technology

Title:

計測デバイス

Document Type and Number:

Japanese Patent JP4963074

Kind Code:

B2

Abstract:

To increase the possibility of high resolution imaging at a deep brain part.

The measurement device comprises a thin substrate and an image sensor chip fixed on the thin substrate. In this case, the image sensor chip comprises a pixel array for which a plurality of pixel cells for performing photoelectric conversion are two-dimensionally disposed, a connection pad for connecting metal wiring on the thin substrate with a wire, a peripheral circuit connected between the pixel array and the connection pad for image measurement by the pixel array, and at least one through-hole provided in a region where the pixel array is formed and made to pass through from a first surface provided with the pixel cells of the image sensor chip to a second surface on the opposite side.

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Inventors:

Toku Takashi Ta
Sadao Shiozaka
Atsushi Ota
Tamura Hideki
Naoki Matsubara
Sugimoto Masuki

Application Number:

JP2007070278A

Publication Date:

June 27, 2012

Filing Date:

March 19, 2007

Export Citation:

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Assignee:

Nara Institute of Science and Technology
Semiconductor Science and Engineering Research Center Co., Ltd.

International Classes:

A61B10/00; A61B1/00; A61B1/04; G01N21/64; H01L27/146

Domestic Patent References:

JP2005535871A
JP2005283568A
JP2005227155A
JP2003083932A
JP2003042954A

Attorney, Agent or Firm:

Takuji Yamada
Mitsuo Tanaka
Masahiro Ishino

Previous Patent: JPS4963073

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