Title:
MEASURING DEVICE HAVING ELECTROTHERMAL TRANSDUCER FOR ADJUSTING THERMAL RESISTANCE, AND METHOD OF OPERATING THE SAME
Document Type and Number:
Japanese Patent JP2022074017
Kind Code:
A
Abstract:
To provide a measuring device for thermal analysis having an efficient and dynamic heat flux.SOLUTION: A measuring device (100) for thermal analysis of a sample is described, the measuring device (100) comprising: i) a sample receptacle (120) for receiving the sample; ii) a heating device (110) for increasing the temperature of the sample receptacle (120); iii) a cooling device (130) for reducing the temperature of the sample receptacle (120); and iv) a heat transport element (140) having thermal resistance. The heat transport element is arranged between the heating device (110) and the cooling device (130) such that a heat flux between the heating device (110) and the cooling device (130) via the heat transport element (140) is enabled. The measuring device (100) further comprises v) an electrothermal transducer (150), and the electrothermal transducer is arranged between the heat transport element (140) and the cooling device (130) such that operating the electrothermal transducer (150) adjusts the heat flux passing through the heat transport element (140).SELECTED DRAWING: Figure 3
Inventors:
PHILIPP THALER
Application Number:
JP2021169643A
Publication Date:
May 17, 2022
Filing Date:
October 15, 2021
Export Citation:
Assignee:
ANTON PAAR GMBH
International Classes:
G01N25/00; G01N25/20
Attorney, Agent or Firm:
Longhua International Patent Service Corporation