Title:
MEASURING METHOD FOR THERMAL DIFFUSIVITY AND INTERFACIAL THERMAL RESISTANCE
Document Type and Number:
Japanese Patent JP3430258
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain a method in which a thermal diffusivity inside a three-layer substance containing especially a nonmetallic substance can be measured precisely and easily.
SOLUTION: A nonmetallic thin film 1 whose thermophysical value is unknown is sandwiched between a first metallic thin film 2 and a second metallic thin film 3 situated on its opposite side, and a sample of a three-layer structure is obtained. The thin films 2, 3 are used in such a way that they are formed of identical kinds of substances having respectively known physical values so as to be in the same thickness. The three-layer substance is arranged on a transparent substrate 4, and the rear surface of the thin film 3 is heated by picosecond light pulses 4 from the lower part in the Figure. The irradiated light pulses are converted into heat within one picosecond in the thin film 3, and they are diffused in an interface/the thin film 1/an interface so as to reach the thin film 2. When a change in the temperature on the surface of the thin film 2 is measured, the thermal diffusivity can be measured precisely by a picosecond thermoreflectance method.
Inventors:
Tetsuya Baba
Application Number:
JP2000317107A
Publication Date:
July 28, 2003
Filing Date:
October 17, 2000
Export Citation:
Assignee:
National Institute of Advanced Industrial Science and Technology
International Classes:
G01N25/18; (IPC1-7): G01N25/18
Domestic Patent References:
| JP7120422A | ||||
| JP763717A |