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Patent Searching and Data


Title:
MEMORY CARD TEST DEVICE
Document Type and Number:
Japanese Patent JPS623500
Kind Code:
A
Abstract:

PURPOSE: To improve the inspection efficiency of memory cards to be tested, to prolong the time interval of attaching/detaching operations, to facilitate the introduction of a robot device, and to execute an unmanned inspection by inspecting plural sheets of the memory cards to be tested continuously.

CONSTITUTION: Address information 23 of an address generating circuit 4 and write data 24 of a data generating circuit 5 are commonly supplied to the N- sheets of the cards to be tested. By selecting information 21 from a selecting circuit 1, an enable signal 22 from a control signal generating circuit 2 is distributed at a distributing circuit 3, and then, successively supplied to the N-sheets of the memory cards to be tested. Only the output of presently-enabled cards 9 is selected at a selecting circuit 6 and compared with the expectation data 25 at a comparing circuit 7. This compared result is displayed at a displaying circuit 8 as an inspection result.


Inventors:
NANBA HISASHI
Application Number:
JP14204385A
Publication Date:
January 09, 1987
Filing Date:
June 28, 1985
Export Citation:
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Assignee:
NEC CORP
International Classes:
G11C29/56; G06K17/00; G11B17/04; G11C29/00; (IPC1-7): G06K17/00; G11B17/04; G11C29/00
Attorney, Agent or Firm:
Naotaka Ide