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Patent Searching and Data


Title:
METER INSPECTION SYSTEM
Document Type and Number:
Japanese Patent JP2004117169
Kind Code:
A
Abstract:

To provide a meter inspection system capable of efficiently inspecting gauges of a plurality of meter devices.

When a gauge inspection system 2 is operated, the position of an inspector detected by way of a GPS satellite 1, a GPS antenna means 2 and a GPS reception analyzing means 4 is confirmed and the position of each meter device 9a and 9j is confirmed with a memory means of customer's home location data input, in advance. With data indicating those locations and data of a gauge inspection distance setting means 6, a gauge location selecting means 7 selects a meter device, capable of meter inspection and then a radio gauge inspecting means 8 inspects these meter devices. In this manner, meter inspection of meter devices decided to be incapable of inspection is eliminated automatically, so that waste is dispensed and the efficiency of meter inspection can be improved.


Inventors:
TANABE MINORU
Application Number:
JP2002280988A
Publication Date:
April 15, 2004
Filing Date:
September 26, 2002
Export Citation:
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Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01C21/00; G01S19/14; H04Q9/00; (IPC1-7): G01C21/00; H04Q9/00
Attorney, Agent or Firm:
Fumio Iwahashi
Tomoyasu Sakaguchi
Hiroki Naito