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Patent Searching and Data


Title:
METHOD AND APERTURE FOR SIGNAL ANALYSIS IN CONTROLLED DRAWING OF SLIVER
Document Type and Number:
Japanese Patent JPH06316820
Kind Code:
A
Abstract:

PURPOSE: To solve trouble and to respond to concrete maintenance and repair requested by analyzing an electrical signal or measured value relating to drawing and making correction on the basis of these analyses.

CONSTITUTION: This method for signal analyses in sliver controlled drawing by detection of measurement signals is characterized in that the detected measurement signal is evaluated with lapse of time with respect to the regulation in an additional signal analysis and, as a result thereof, an actual signal eigen quantity is formed and is compared with a temporarily stored precedent signal eigen quantity. If both coincide within a prescribed error range, the actual signal eigen quantity described above is inputted to an assigned storage place. If both do not coincide, the direct question to all of the associated signal analysis values which are temporarily stored is made in association with knowledge information value and deviations are analyzed according to the kinds of errors.


Inventors:
DENTSU PEETAA
Application Number:
JP14651493A
Publication Date:
November 15, 1994
Filing Date:
June 17, 1993
Export Citation:
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Assignee:
RIETER INGOLSTADT SPINNEREI
International Classes:
D01H5/32; D01H5/42; D01H13/22; G05B13/02; G05B23/02; H02P5/46; (IPC1-7): D01H5/32; D01H13/22; H02P5/46
Attorney, Agent or Firm:
Tajiro Taiji