Title:
Ｘ線検出器における検出量子効率を改善する方法および装置
Document Type and Number:
Japanese Patent JP7219092
Kind Code:
B2
Abstract:
The disclosure is directed at a method and apparatus for improving method and apparatus for improved modulation transfer function and detective quantum efficiency of X-ray detectors. The method and apparatus include digitizing microelement outputs obtained by micro sensor elements and the generating pixel outputs from these digitized microelement outputs. Each pixel output is the sum of a plurality of weighting factored microelement outputs.
Inventors:
Karim, Karim S.
Cunningham, Ian A.
Cunningham, Ian A.
Application Number:
JP2018562393A
Publication Date:
February 07, 2023
Filing Date:
February 16, 2017
Export Citation:
Assignee:
Karim, Karim S.
Cunningham, Ian A.
Cunningham, Ian A.
International Classes:
G01T1/17; G01T1/20; G01T1/24; G01T7/00; H04N5/32; H04N25/60
Domestic Patent References:
| JP7287330A | ||||
| JP2006346460A | ||||
| JP2009018154A |
Foreign References:
| US20080011960 | ||||
| US20100215230 | ||||
| US20110116700 | ||||
| US20150063545 | ||||
| US20150146853 |
Other References:
Elina Ismailova et al.,,Apodized-aperture pixel design to increase high -frequency DQE and reduce noise aliasing in x-ray detectors,Proceedings of SPIE,米国,The international Society for Optical Engineering,2015年03月18日,Vol. 9412,pp. 94120D-1 - 94120D-8
Attorney, Agent or Firm:
Morishita Kenki
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