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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING FREQUENCY
Document Type and Number:
Japanese Patent JPH0815340
Kind Code:
A
Abstract:

PURPOSE: To obtain method and apparatus for measuring the frequency with very high accuracy using GPS where accuracy deterioration (SA) is effected intentionally.

CONSTITUTION: Frequency is measured using 1PPS from a GPS for obtaining the positioning information based on the distance measuring radio waves transmitted from a plurality of satellites. The phase differences Δt(t1), Δt(t2) between the 1PPS (1sec signal) from the GPS and a frequency to be measured are determined at two measuring times t1, t2 having a large interval. Δf/f (f: frequency to be measured, Δf: microshift of frequency) is then determined based on the phase difference Δt(t1), Δt(t2).


Inventors:
ONO TAKANORI
Application Number:
JP16463094A
Publication Date:
January 19, 1996
Filing Date:
June 23, 1994
Export Citation:
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Assignee:
TOYO COMMUNICATION EQUIP
International Classes:
G01R23/02; (IPC1-7): G01R23/02
Attorney, Agent or Firm:
Suzuki Hitoshi