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Title:
METHOD AND APPARATUS FOR MEASURING IMPEDANCE OF π-TYPE IMPEDANCE NETWORK
Document Type and Number:
Japanese Patent JP2006250743
Kind Code:
A
Abstract:

To provide a method and an apparatus for measuring an impedance of a π-type impedance network, capable of precisely measuring the impedance of a first impedance element in the π-type impedance network, in consideration of a wiring impedance Yline.

In the method for measuring the impedance of the π-type impedance network, a network analyzer is used, having a signal output section O1 from which an output of a signal source is delivered, a measuring section A for measuring an input voltage, and a measuring section R for measuring a reference voltage. In the method, one measuring terminal 4 of two measuring terminals of the π-type impedance network is connected to the signal output section O1, and the other measuring terminal 5 is connected to the measuring section A, and a voltage ratio of the measuring sections A, R is obtained in order to measure the impedance of the first impedance element in the π-type impedance network. Five kinds of reference impedance are connected to the network analyzer, and measurements are carried out, and the voltage ratio of the measuring sections A, R is obtained.


Inventors:
NISHIOKA YOSHINAO
Application Number:
JP2005068376A
Publication Date:
September 21, 2006
Filing Date:
March 11, 2005
Export Citation:
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Assignee:
MURATA MANUFACTURING CO
International Classes:
G01R27/02
Attorney, Agent or Firm:
Hidetaka Tsutsui



 
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