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Title:
物体を測定するための方法および装置
Document Type and Number:
Japanese Patent JP7113814
Kind Code:
B2
Abstract:
A technique is described for measuring an object (6;41) using a machine tool (2) carrying a scanning probe (4). The machine tool is arranged to drive the scanning probe (4) along a pre-programmed scan path (50) relative to the object (41) and the scanning probe (4) is arranged to collect probe data (60) describing a spatial relationship of the surface of the object relative to the scanning probe whilst the scan path (50) is traversed. The described method comprises driving the scanning probe (4) along the scan path (50) whilst collecting probe data (60) and analysing that probe data (60) to determine an offset (V) of the object that comprises a translation and/or rotation and/or scaling of the object (41). The scan path (50) is then translated and/or rotated and/or scaled relative to the object (41) by a known amount and the data collection and analysis repeated to re-determine the offset of the object. An error map or function is then established that describes the difference between the re-determined offset and an offset expected to result from the applied translation and/or rotation and/or scaling of the scan path (50) relative to the object (41). The error map or function may be used for measurements of other objects nominally identical to the object (41).

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Inventors:
Derek Marshall
John Charles Ould
Application Number:
JP2019514095A
Publication Date:
August 05, 2022
Filing Date:
September 27, 2017
Export Citation:
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Assignee:
RENISHAW PUBLIC LIMITED COMPANY
International Classes:
G01B5/00; B23Q17/22; G01B21/04; G05B19/401
Domestic Patent References:
JP2010519533A
JP2005531780A
JP2012088331A
JP2007506959A
JP2015531854A
Foreign References:
WO2015036796A1
US20110000277
US20070028677
Attorney, Agent or Firm:
Patent Attorney Tani / Abe Patent Office



 
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