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Patent Searching and Data


Title:
METHOD AND APPARATUS FOR MEASURING THICKNESS
Document Type and Number:
Japanese Patent JPH08170910
Kind Code:
A
Abstract:

PURPOSE: To measure the thickness while suppressing the effect of contact substance and limitation on the shape of an object.

CONSTITUTION: A transmitter 2 transmits an ultrasonic wave to an objective pipe 10. A surface reflection wave transmitted through a contact substance A and reflected on the surface of the pipe 10, and a bottom face reflection wave transmitted through an oxide layer 11 and reflected on the inner face of the pipe 10 are received by a receiver 3 and converted into electric signals. Based on the ultrasonic receiving signal converted into electric signal, a feature extracting section 5 extracts a predetermined signal feature data having strong correlation with the thickness at a measuring part from the correlation data of signal energy with the frequency of receiving signal. Based on the signal feature data thus extracted, a thickness converting section 7 determines the thickness of the oxide layer with reference to a section 6 previously storing a function representative of the relationship between the signal feature data and the thickness of the oxide layer.


Inventors:
NAGASHIMA YOSHIAKI
FUJIWARA KENICHI
SATO MASAO
TAKAHASHI FUMINOBU
KOIKE MASAHIRO
UMEHARA HAJIME
MICHIGUCHI YOSHIHIRO
Application Number:
JP26964295A
Publication Date:
July 02, 1996
Filing Date:
October 18, 1995
Export Citation:
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Assignee:
HITACHI LTD
HITACHI NUCLEAR ENG
International Classes:
G01B17/02; G01N29/00; (IPC1-7): G01B17/02; G01N29/20
Attorney, Agent or Firm:
Unuma Tatsuyuki