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Title:
METHOD FOR AUTOMATICALLY DETECTING DEFECT IN MECHANICAL PART HAVING COMPLICATED FORM
Document Type and Number:
Japanese Patent JPH1090203
Kind Code:
A
Abstract:

To provide a detecting method of defect applicable to automatic detection of the defect of a part having a complicated form by dividing a fluoroscopic image to two classes corresponding to evaluable zone and non- evaluable zone.

The fluoroscopic image of a part is divided into two classes of zones, which correspond homogeneous evaluable zone and non-evaluable zone, respectively, and the result of the division is displayed in the form of a binary image called a mask M. To obtain the mask M, the residual zone having a small size is blocked by utilizing blocking work to the resulting image. When the residual non-evaluable zone is blocked, the resulting image is a two- phase image, and its gray level value shows the evaluable zone and non- evaluable zone of the fluoroscopic image. The boundary of the images is determined so as to provide the binary image, respectively. The binary image constitutes a conditional shape transformation with the mask, and it is applied to the resulting two-phase image so that the shape transformation can clarify a defect.


Inventors:
JOCHEMS TILMAN
PREJEAN LEFEVRE VERONIQUE HELE
Application Number:
JP23483497A
Publication Date:
April 10, 1998
Filing Date:
August 29, 1997
Export Citation:
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Assignee:
SNECMA
International Classes:
B22D29/00; B22D46/00; F01D25/00; F02C7/00; G01N23/04; G01N23/18; (IPC1-7): G01N23/18; B22D29/00; B22D46/00; F01D25/00; G01N23/04
Attorney, Agent or Firm:
Yoshio Kawaguchi (2 outside)