Title:
METHOD FOR DECIDING ON GENUINENESS OF UNEVEN PATTERN SUBSTRATE, UNEVEN PATTERN SUBSTRATE, AND DISCRIMINATING TOOL
Document Type and Number:
Japanese Patent JP3777419
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a method for deciding on genuineness of an uneven pattern substrate, an uneven pattern substrate, and a discriminating tool.
SOLUTION: An uneven pattern is provided on a substrate 1, made difficult for the naked eye to recognize. The discriminating tool 2 is a light permeable substrate with a line pattern or a halftone pattern printed thereon. The pattern printed surface of the tool 2 is brought into close contact with the uneven pattern on the substrate 1. Upon observation of the region wherein the tool 2 is in close contact with the uneven pattern on the substrate 1, the uneven pattern is recognized with the naked eye.
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Inventors:
Kawaguchi Yasumasa
Kazuhiro Hiwatari
Takashi Yoshida
Kazuhiro Hiwatari
Takashi Yoshida
Application Number:
JP2001335944A
Publication Date:
May 24, 2006
Filing Date:
November 01, 2001
Export Citation:
Assignee:
National Printing Bureau
International Classes:
B42D15/10; B41J2/22; G07D7/00; B41J3/50; B41J29/00; B41M3/14; B44F1/12; G03G21/04; G07D7/12; G07D7/20; (IPC1-7): G07D7/00; B41J2/22; B41J3/50; B41J29/00; B44F1/12; G03G21/04; G07D7/12; G07D7/20; //B41M3/14; B42D15/10
Domestic Patent References:
| JP7052524A | ||||
| JP59120491A | ||||
| JP2000280663A | ||||
| JP2001026177A | ||||
| JP2001130125A | ||||
| JP2001039004A |
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