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Title:
METHOD FOR DESIGNING PHASE GRATING PATTERN PRESENTING DEFORMED ILLUMINATION AND METHOD FOR MANUFACTURING PHOTOMASK BY USING THE SAME
Document Type and Number:
Japanese Patent JP2004029806
Kind Code:
A
Abstract:

To provide a method for designing a phase grating pattern to present deformed illumination and to provide a method for manufacturing a photomask by using the method.

The method for designing a phase grating pattern includes steps of: selecting arbitrary deformed illumination to be provided to the pattern to be transferred onto a wafer in a photolithographic process; determining a unit region where the phase grating is realized; dividing the unit region into many subordinate cells; assigning a desired phase as the initial phase to each subordinate cell; and repeating processes of randomly selecting one of the subordinate cells and varying the phase of the selected cell so as to randomly varying the arrangement of phases assigned to the subordinate cells and to search the arrangement of phases matching with the selected deformed illumination.


Inventors:
PARK JONG-RAK
Application Number:
JP2003171320A
Publication Date:
January 29, 2004
Filing Date:
June 16, 2003
Export Citation:
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Assignee:
SAMSUNG ELECTRONICS CO LTD
International Classes:
G03F1/26; G03F1/68; G03F1/76; G03F7/20; H01L21/027; G02B5/18; (IPC1-7): G03F1/08; G02B5/18; G03F7/20; H01L21/027
Domestic Patent References:
JPH0862851A1996-03-08
JPH0645220A1994-02-18
JP2001210588A2001-08-03
JPH07140642A1995-06-02
JPH06120119A1994-04-28
JP2000155408A2000-06-06
JPH09325467A1997-12-16
JPH11328246A1999-11-30
JP2000197270A2000-07-14
JPH05166700A1993-07-02
JPH06236135A1994-08-23
Attorney, Agent or Firm:
Masatake Shiga
Takashi Watanabe