Title:
METHOD FOR DETERMINING CORRELATED WAVEFORM AND TEST/MEASUREMENT DEVICE
Document Type and Number:
Japanese Patent JP2016024200
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To accurately determine a correlated waveform.SOLUTION: A method for determining a correlated waveform includes; acquiring a generalized waveform record with a repeating pattern; determining a possibly corrected recovered clock signal for the generalized waveform record; selecting a new sample rate that is higher than the clock rate by N times (N is an integer greater than 1); resampling the generalized waveform so that the new samples fall precisely on two clock instants of the recovered clock signal that define each unit interval, and on N-1 additional instants equally spaced between the two clock instants of each unit interval to create a resampled waveform; and forming the correlated waveform by taking the mean values of all samples from the resampled waveform having the same offset into a pattern repeat in unit intervals or fractions thereof.SELECTED DRAWING: Figure 10
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Inventors:
MARK L GUENTHER
Application Number:
JP2015143987A
Publication Date:
February 08, 2016
Filing Date:
July 21, 2015
Export Citation:
Assignee:
TEKTRONIX INC
International Classes:
G01R13/34; G01R13/20; G01R29/02
Attorney, Agent or Firm:
Yamaguchi International Patent Office