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Title:
METHOD AND DEVICE FOR CHECKING ALIGNMENT LAYER AND PRODUCTION OF LIQUID CRYSTAL ELEMENT
Document Type and Number:
Japanese Patent JPH11202333
Kind Code:
A
Abstract:

To precisely and effectively detect a material change generated on the surface of an alignment layer as orientation regulation power by dripping liquid on the alignment layer, to which uniaxial aligning treatment is performed, and evaluating the alignment regulation power of the alignment layer from the shape of the drops of liquid.

Whiule using a dispenser 25, liquid crystal is dripped onto a substrate 1 to which the uniaxial aligning treatment is performed. As soon as the liquid crystal is dripped, the dispenser 25 moves outside the field of view of an image input device 27. After the liquid crystal is dripped, an image is fetched by the image input device 27 at the interval of about 0.5 sec just before a liquid drop 2 of liquid crystal reaches the substrate 1, the image is analyzed by an image processor 28, and the shape anisotropy of the liquid drop 2 is evaluated. The image processor 28 performs binarizing processing to the fetched image, makes clear the difference of the liquid drop 2 and the background (substrate 1), measures the long axis and short axis of the elliptic liquid drop 2 and calculates oblateness. Concerning the alignment layer with which the desired liquid crystal alignment is provided, this oblateness is previously investigated, the calculated oblateness is compared with the desired oblateness for a following panel, and the propriety of aligning treatment is judged.


Inventors:
KODERA YASUHITO
KOBAYASHI FUMIKAZU
Application Number:
JP435898A
Publication Date:
July 30, 1999
Filing Date:
January 13, 1998
Export Citation:
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Assignee:
CANON KK
International Classes:
G01B11/24; G01B11/245; G01M11/00; G02F1/1337; (IPC1-7): G02F1/1337; G01B11/24; G01M11/00
Attorney, Agent or Firm:
Keisuke Watanabe (1 person outside)