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Title:
METHOD AND DEVICE FOR CONDUCTING WIRE TENSION TEST OF CIRCUIT DEVICE
Document Type and Number:
Japanese Patent JP2858402
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To easily conduct the test for connection strength, when the mutual interval of wires is narrow by adjacently arranging pulling members whose tip parts are rod forms to the wires, turning them, hooking the wires on the tip parts, turning them further, giving a tension force to the wires and conducting the strength of the connection of the wires.
SOLUTION: Tension members 16 are arranged at the right sides of the uppermost parts of wires 15 with X and Y-axes direction moving mechanism of a driving device 19. The tip parts 17 of the tension members 16 are arranged to be lower than the heights of the uppermost parts of the wires 15, with the Z-axis direction moving mechanism of the driving device 19. Then, the tension members 16 are turned clockwise by only a prescribed angle θ, for example. Then, the wires 15 are caught by the tip parts 17 of the tension members 16, and the wires 15 are pulled to a diagonally upper direction at the tip parts 17, so that they have upper components. Thus, the tension test for the plural wires whose inter-intervals is narrow or the wires arranged near the other members can be conducted easily.


Inventors:
NISHIMURA TATSUYA
IWAKI RYOJI
Application Number:
JP7461597A
Publication Date:
February 17, 1999
Filing Date:
March 10, 1997
Export Citation:
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Assignee:
SANKEN DENKI KK
International Classes:
G01N19/04; H01L21/60; H01L21/66; (IPC1-7): H01L21/60; G01N19/04; H01L21/60; H01L21/66
Domestic Patent References:
JP10107094A
JP817879A
JP523541U
JP2102735U
Attorney, Agent or Firm:
Takano Noritsuji