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Title:
METHOD AND DEVICE FOR EVALUATING SOLDER WETTABILITY
Document Type and Number:
Japanese Patent JP2007242944
Kind Code:
A
Abstract:

To provide a method and a device for inspecting solder wettability with a simple device configuration in a short process time.

In a reference contact angle determining process and an inspection light inclination setting process as preparation processes, a contact angle as a reference is determined in advance, and the radiation angle of the inspection light emitted from the light source of a light-source integrated camera is so set as to be vertical to the plane corresponding to the contact angle. The inspection light which is aligned for setting an inclination in a light source shifting process is radiated to the surface of a solder fillet which is to be inspected. The surface of the solder fillet is imaged in a fillet surface imaging process. The image is processed for binarizing or the like in an image processing process. The solder wettability is judged based on the process result in a solder wettability evaluation process.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
SHIMODA MASAYOSHI
Application Number:
JP2006064233A
Publication Date:
September 20, 2007
Filing Date:
March 09, 2006
Export Citation:
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Assignee:
FUJI ELECTRIC HOLDINGS
International Classes:
H05K3/34; B23K1/00; G01B11/26; G01N13/02; B23K101/42
Domestic Patent References:
JPH02243911A1990-09-28
JPH02183104A1990-07-17
JPH0815171A1996-01-19
Attorney, Agent or Firm:
Hiroshi Yamamoto