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Title:
METHOD AND DEVICE FOR SUPPLY VOLTAGE GLITCH DETECTION IN MONOLITHIC INTEGRATED CIRCUIT DEVICE
Document Type and Number:
Japanese Patent JP2015228639
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a method and a device for detecting a supply voltage glitch in a monolithic integrated circuit device.SOLUTION: The monolithic integrated circuit device includes a supply voltage glitch detector to detect an inappropriate supply voltage state. Advantageously, the detection threshold of the supply voltage glitch detector is adaptively set based on a device operation mode or a specific part known from a specific input received by the device. For example, the specific input includes a command, a suspension, a control signal, etc.

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Inventors:
NIR TASHER
VALERY TEPER
DENNIS CHIN CHENG
HUANG KOYING
Application Number:
JP2015009679A
Publication Date:
December 17, 2015
Filing Date:
January 21, 2015
Export Citation:
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Assignee:
HUABANG ELECTRONIC CO LTD
International Classes:
H03K17/22; G01R31/319; H03K19/00
Domestic Patent References:
JP2010154355A2010-07-08
JP2007172350A2007-07-05
JP2012133222A2012-07-12
JP2010154366A2010-07-08
JP2007172350A2007-07-05
Attorney, Agent or Firm:
Takahisa Sato



 
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