PURPOSE: To quickly discover the faulty parts of a device constituting a plant and repairing measures therefor.
CONSTITUTION: Plant process setting values Sp1 and Sp2 and raw material characteristic values (k) and (h) selected in accordance with the characteristics of a plant are stored and plant process values Pi (i=1, 2, 3,...) and device process values Mj (j=1, 2, 3,...) are measured. The computed value of a specific device selected out of the devices constituting a plant is found by applying numerical values to the device characteristic expression Cm (m, 1, 2, 3,...) of the device containing the plant process value, device process value, raw material characteristic value of the device and, in case the computed value found from the device characteristic expression is out of a preset prescribed range, it is presumed that the corresponding device is faulty even when the measured plant process value is within a prescribed range of the corresponding set value. The cause of the fault corresponding to the abnormality is retrieved from prestored knowledge and the measure corresponding to the cause from prestored measures and the retrieved cause and measure are displayed on a displaying section.
KAMEOKA SEIJI
KOBUSA KOUJI
