METHOD FOR EMISSION SPECTRAL ANALYSIS

Japanese Patent JP3733966

B2

PROBLEM TO BE SOLVED: To provide a method for emission spectral analysis being simple and ensuring high analytical accuracy while making it possible to extend the lower limit of determination for elements to be analyzed.
SOLUTION: The invention is to improve the method for emission spectral analysis which comprises causing spark discharges many times between a metal sample and a counter electrode in an inert gas atmosphere, making spectral diffraction of light emitted from the metal sample excited at each discharge, measuring and digitizing the strength of a spectral line characteristic of each element obtained, accumulating these digital values using a calculator, and performing arithmetic process to determine the content of each element. Spark emission spectrometry is effected on the metal sample with few abnormal crystal structures and nonmetallic inclusions. A discharge current value of each discharge is measured. The current values are all processed as data into a frequency distribution of the frequencies of occurrence and the discharge current values. The distribution is truncated at its top and bottom to obtain top and bottom ares. The digitized strength values of the spectral lines characteristic of the elements, which correspond to the current values within the top and bottom areas, are accumulated and computed using a calculator.

Takashi Sugihara

JP2004002870A

January 11, 2006

January 08, 2004

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jfe Steel Corporation

G01N21/67; (IPC1-7): G01N21/67

JP5858446A
JP5168886A
JP6035247U

Yoshio Kosugi
Masaki Yamada

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