Title:
METHOD FOR EVALUATING QUALITY OF DELAY FAULT TEST
Document Type and Number:
Japanese Patent JP2004252961
Kind Code:
A
Abstract:
To resolve the problem that a fault detection rate doesn't correctly reflect the test quality by calculating the fault detection rate without excluding the number of untestable faults when calculating the fault detection rate of a test sequence for delay fault because it is difficult to calculate all untestable delay faults.
A method for evaluating the quality of delay fault test is provided which selects partial delay faults and analyzes the number of untestable delay faults out of the selected delay faults to estimate the number of untestable faults including in all delay faults and uses this number to calculate the fault detection rate correctly reflecting the test quality.
Inventors:
TAKEOKA SADAMI
KAJIWARA SEIJI
KAJIWARA SEIJI
Application Number:
JP2004018291A
Publication Date:
September 09, 2004
Filing Date:
January 27, 2004
Export Citation:
Assignee:
MATSUSHITA ELECTRIC IND CO LTD
International Classes:
G01R31/28; G01R31/30; G01R31/3181; G06F17/50; G06K5/04; G11B5/00; G11B20/20; (IPC1-7): G06F17/50; G01R31/28
Attorney, Agent or Firm:
Shohei Oguri
Hironori Honda
Toshimitsu Ichikawa
Takeshi Takamatsu
Yuriko Hamada
Hironori Honda
Toshimitsu Ichikawa
Takeshi Takamatsu
Yuriko Hamada