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Title:
METHOD FOR INSPECTING FLAW OF OPTICAL INFORMATION RECORDING MEDIUM
Document Type and Number:
Japanese Patent JPS6361150
Kind Code:
A
Abstract:

PURPOSE: To rapidly detect the flaw of an optical information recording medium with high accuracy, by irradiating an org. membrane with white light through an optical filter capable of cutting a wavelength equal to ore less than the max. absorption wavelength of the org. membrane and detecting the partial variation of the transmitted light thereof.

CONSTITUTION: An optical filter 3 cutting a wavelength equal to or less than the max. absorption wavelength of an org. membrane is used in this flaw inspection method. At this time, since the quantity of detection light itself is reduced in a filter cutting the wavelength in a long wavelength region, detection capacity is lowered and effect of a certain degree is shown in a filter cutting the wavelength in a short wavelength region but detection capacity is gradually lowered. By inspecting the flaw of the org. membrane of an optical information recording medium 4 by the visual observation of transmitted light using an apparatus constituted of a light source 1, a diffusion plate 2, an optical filter 3 and a lens system 5, the flaw can be detected rapidly and easily with high accuracy as compared with conventional visual inspection with white light not passed through the optical filter.


Inventors:
ICHINOSE KEIKO
SATO TSUTOMU
Application Number:
JP20628586A
Publication Date:
March 17, 1988
Filing Date:
September 01, 1986
Export Citation:
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Assignee:
RICOH KK
International Classes:
G01N21/88; G01N21/95; G11B7/26; (IPC1-7): G01N21/88; G11B7/26
Domestic Patent References:
JP61131648B
JPS52126219A1977-10-22
Attorney, Agent or Firm:
Tsukimura Shigeru