To provide a method for manufacturing a novel epitaxial substrate and semiconductor laminated structure utilizing the same to form a nitride layers group with low dislocation and excellent in crystallinity.
The method for manufacturing the epitaxial substrate includes: a manufacturing step of forming a group-III nitride base layer 2 on preset base material 1; a manufacturing step of forming a group-III nitride layer 3 containing at least Ga on the group-III nitride base layer 2 by an MOCVD method in two stages of the former stage for forming a film and the latter stage for forming the film; and a manufacturing step of forming a group-III nitride interlayer 4 under the lower temperature than the forming temperature of the group-III nitride layer 3, between the former stage and the latter stage for forming the group-III nitride layer 3.
JP2013187366 | NITRIDE SEMICONDUCTOR MANUFACTURING METHOD |
JPS63227090 | SEMICONDUCTOR LASER DEVICE AND MANUFACTURE THEREOF |
JPH05136134 | SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
SAKAI MASAHIRO
EGAWA TAKASHI
ISHIKAWA HIROYASU
NAGOYA INST TECHNOLOGY
JPH0856015A | 1996-02-27 | |||
JP2001274096A | 2001-10-05 | |||
JPH11219909A | 1999-08-10 | |||
JP2002270514A | 2002-09-20 |
Kiyoshi Kuruma
Nobuyuki Okajima
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