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Title:
METHOD FOR MANUFACTURING EPITAXIAL SUBSTRATE AND SEMICONDUCTOR LAMINATED STRUCTURE
Document Type and Number:
Japanese Patent JP2009060140
Kind Code:
A
Abstract:

To provide a method for manufacturing a novel epitaxial substrate and semiconductor laminated structure utilizing the same to form a nitride layers group with low dislocation and excellent in crystallinity.

The method for manufacturing the epitaxial substrate includes: a manufacturing step of forming a group-III nitride base layer 2 on preset base material 1; a manufacturing step of forming a group-III nitride layer 3 containing at least Ga on the group-III nitride base layer 2 by an MOCVD method in two stages of the former stage for forming a film and the latter stage for forming the film; and a manufacturing step of forming a group-III nitride interlayer 4 under the lower temperature than the forming temperature of the group-III nitride layer 3, between the former stage and the latter stage for forming the group-III nitride layer 3.


Inventors:
TANAKA MITSUHIRO
SAKAI MASAHIRO
EGAWA TAKASHI
ISHIKAWA HIROYASU
Application Number:
JP2008297124A
Publication Date:
March 19, 2009
Filing Date:
November 20, 2008
Export Citation:
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Assignee:
NGK INSULATORS LTD
NAGOYA INST TECHNOLOGY
International Classes:
H01L21/205; C23C16/34
Domestic Patent References:
JPH0856015A1996-02-27
JP2001274096A2001-10-05
JPH11219909A1999-08-10
JP2002270514A2002-09-20
Attorney, Agent or Firm:
Kenji Sugimura
Kiyoshi Kuruma
Nobuyuki Okajima