Title:
METHOD FOR MANUFACTURING SPECTROSCOPIC ANALYZER
Document Type and Number:
Japanese Patent JP2020173231
Kind Code:
A
Abstract:
To suppress the device cost of a spectroscopic analyzer that uses an optical filter.SOLUTION: One embodiment of the present invention is a method for manufacturing a spectroscopic analyzer that detects an electromagnetic wave having had its frequency characteristic changed by absorption, etc., by a sample by passing it through a plurality of filters, each having mutually different permeation characteristics, and performs the qualitative analysis, etc., of the sample by data processing based on a plurality of detection results. The data processing includes a mixed amount calculation step for calculating the mixed amount of each raw material (mixed amount matrix W) used for forming each of the plurality of optical filters utilizing a determination analysis in which a determination model constructed by machine learning is used, and an optical filter production step for producing a plurality of optical filters on the basis of the mixed amount. In the mixed amount calculation step, the optimization of the mixed amount of each raw material is carried out simultaneously in parallel or alternately with the optimization of the determination model or regression model by machine learning.SELECTED DRAWING: Figure 3
Inventors:
NODA HIROMI
Application Number:
JP2019076778A
Publication Date:
October 22, 2020
Filing Date:
April 15, 2019
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01J3/02; G01N21/27; G02B5/22
Attorney, Agent or Firm:
Kyoto International Patent Office