Title:
METHOD FOR MEASURING THRESHOLD VOLTAGE
Document Type and Number:
Japanese Patent JPH04326074
Kind Code:
A
Abstract:
PURPOSE: To measure the threshold voltage of a gate element by detecting a current change.
CONSTITUTION: The output voltages from gate elements 4, 5 are applied to the gate terminal of an MOS transistor and switching is performed on the basis of said output voltages. When the MOS transistor becomes an ON-state, a current flowing in large quantity is detected to set the input voltages applied to input terminals 7, 9 at this time to the threshold voltages of the gate elements 4, 5.
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Inventors:
MORIMOTO TAKASHI
Application Number:
JP12250391A
Publication Date:
November 16, 1992
Filing Date:
April 25, 1991
Export Citation:
Assignee:
FUJITSU LTD
International Classes:
G01R19/175; G01R31/26; G01R19/165; (IPC1-7): G01R19/165; G01R19/175; G01R31/26
Attorney, Agent or Firm:
Takashi Honma